Estimation of amorphous fraction in multilevel phase-change memory cellsNikolaos PapandreouA. Pantaziet al.2010Solid-State Electronics
Nanoscale phase transformation in Ge2 Sb2 Te 5 using encapsulated scanning probes and retraction force microscopyHarish BhaskaranAbu Sebastianet al.2009Review of Scientific Instruments
Signal transformation approach to fast nanopositioningAbu SebastianS. O. Reza Moheimani2009Review of Scientific Instruments
Encapsulated tips for reliable nanoscale conduction in scanning probe technologiesHarish BhaskaranAbu Sebastianet al.2009Nanotechnology
Nanoscale PtSi tips for conducting probe technologiesHarish BhaskaranAbu Sebastianet al.2009IEEE TNANO
Probe-based ultrahigh-density storage technologyAngeliki PantaziAbu Sebastianet al.2008IBM J. Res. Dev
Achieving subnanometer precision in a MEMS-based storage device during self-servo write processAbu SebastianAngeliki Pantaziet al.2008IEEE TNANO
Modeling and experimental identification of silicon microheater dynamics: A systems approachAbu SebastianDorothea Wiesmann2008JMEMS
Control of MEMS-based scanning-probe data-storage devicesAngeliki PantaziAbu Sebastianet al.2007IEEE TCST
A review of the systems approach to the analysis of dynamic-mode atomic force microscopyAbu SebastianAnil Gannepalliet al.2007IEEE TCST