Identifying and Removing Artifacts Formed During FIB TEM Sample Preparation of Semiconductor Devices
- Lynne Gignac
- John Bruley
- et al.
- 2025
- AReMS 2025
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6 results for Luxherta Buzi
A Novel Chalcogenide Based CuGeSe Selector Only Memory (SOM) for 3D Xpoint and 3D Vertical Memory Applications
- Wei-Chih Chien
- Jeffrey Zheng
- et al.
- 2024
- VLSI Technology and Circuits 2024
New Phase-Change Materials by Atomic-Level Engineering the Dopants for Extremely Low Vth Drift at 85oC and High Endurance 3D Crosspoint Memory
- Michelle Cheng
- Alexander Grun
- et al.
- 2022
- IEDM 2022
Towards Enhanced Sustainability in Future Plasma Processes
- Nathan Marchack
- Hiro Miyazoe
- et al.
- 2022
- MRS Spring Meeting 2022
Optimizing AsSeGe Chalcogenides by Dopants for Extremely Low IOFF, High Endurance and Low Vth Drift 3D Crosspoint Memory
- Huai-Yu Cheng
- Wei-Chih Chien
- et al.
- 2021
- IEDM 2021
2X reduction of STT-MRAM switching current using double spin-torque magnetic tunnel junction
- Guohan Hu
- Jonathan Sun
- et al.
- 2021
- IEDM 2021