Precession Electron Diffraction (PED) Strain Characterization in Stacked Nanosheet FET Structure
- Juntao Li
- Shogo Mochizuki
- et al.
- 2022
- ISTFA 2022
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3 results for Erin P. Stuckert
Gate-Last IO Transistors based on Stacked Gate-All-Around Nanosheet Architecture for Advanced Logic Technologies
- M. Bhuiyan
- M. Kim
- et al.
- 2021
- IEDM 2021
Comparison of CO and CO2rf plasma treatment of SnO2nanoparticles for gas sensing materials
- Kimberly A. M. Hiyoto
- Erin P. Stuckert
- et al.
- 2021
- JVSTA