Open Block Characterization and Read Voltage Calibration of 3D QLC NAND FlashNikolaos PapandreouHaralampos Pozidiset al.2020IRPS 2020
Characterization and Analysis of Bit Errors in 3D TLC NAND Flash MemoryNikolaos PapandreouHaralampos Pozidiset al.2019IRPS 2019