Delamination in patterned films
- X.-H. Liu
- M.W. Lane
- et al.
- 2007
- Int. J. Solids Struct.
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148 results for Thomas M. Shaw
Formation and Microstructure of Mg‐Si‐O–N Glasses
- T.M. SHAW
- G. THOMAS
- et al.
- 2006
- JACerS
Thermal stress evolution in embedded Cu/low-k dielectric composite features
- Conal E. Murray
- Charles C. Goldsmith
- et al.
- 2006
- Applied Physics Letters
Simple model for time-dependent dielectric breakdown in inter- and intralevel low- k dielectrics
- J.R. Lloyd
- E. Liniger
- et al.
- 2005
- Journal of Applied Physics
Issues in the Processing of Cuprate Ceramic Superconductors
- David R. Clarke
- Thomas M. Shaw
- et al.
- 2005
- JACerS
Detection of open or closed porosity in low-κ dielectrics by solvent diffusion
- Marcus A. Worsley
- Mark Roberts
- et al.
- 2005
- Microelectronic Engineering
Preparation and Sintering of Homogeneous Silicon Nitride Green Compacts
- T.M. SHAW
- B.A. PETHICA
- 2005
- JACerS
Liquid Redistribution during Liquid‐Phase Sintering
- T.M. SHAW
- 2005
- JACerS
Forces between Aluminum Oxide Grains in a Silicate Melt and Their Effect on Grain Boundary Wetting
- Thomas M. Shaw
- Peter R. Duncombe
- 2005
- JACerS
Electromigration and adhesion
- James R. Lloyd
- Michael W. Lane
- et al.
- 2005
- IEEE T-DMR