Detecting Fermi-level shifts by Auger electron spectroscopy in Si and GaAs
- J. Debehets
- P. Homm
- et al.
- 2018
- Applied Surface Science
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3 results for M. Heyns
On the high-field transport and uniaxial stress effect in Ge PFETs
- Masaharu Kobayashi
- Jérǒme Mitard
- et al.
- 2011
- IEEE T-ED
Impact of the electrochemical properties of silicon wafer surfaces on copper outplating from HF solutions
- I. Teerlinck
- P.W. Mertens
- et al.
- 1996
- JES