Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography
- Yu Kyoung Ryu
- Colin D. Rawlings
- et al.
- 2017
- ACS Nano
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3 results for Tevis D. B. Jacobs
Wear-resistant nanoscale silicon carbide tips for scanning probe applications
- Mark A. Lantz
- Bernd Gotsmann
- et al.
- 2012
- Advanced Functional Materials
On the application of transition state theory to atomic-scale wear
- Tevis D. B. Jacobs
- Bernd Gotsmann
- et al.
- 2010
- Tribology Letters