Investigation of the relationship between reflectance difference spectroscopy and surface structure using grazing incidence X‐ray scattering
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1995
- physica status solidi (a)
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16 results for Paul H. Fuoss
GaAs c(4×4) surface structure in organometallic vapor-phase epitaxy
- A.P. Payne
- P.H. Fuoss
- et al.
- 1994
- Physical Review B
X-ray-scattering analysis of surface structures produced by vapor-phase epitaxy of GaAs
- F.J. Lamelas
- P.H. Fuoss
- et al.
- 1994
- Physical Review B
Gallium arsenide surface reconstructions during organometallic vapor-phase epitaxy
- F.J. Lamelas
- P.H. Fuoss
- et al.
- 1992
- Applied Physics Letters
Atomic scale characterization of organometallic vapor phase epitaxial growth using in-situ grazing incidence X-ray scattering
- D.W. Kisker
- G.B. Stephenson
- et al.
- 1992
- Journal of Crystal Growth
The Si(001)/SiO2 interface
- A. Ourmazd
- P.H. Fuoss
- et al.
- 1990
- Applied Surface Science