Theoretical and experimental analysis of capacitance and mobility in InGaAs
- F.M. Bufler
- M. Frey
- et al.
- 2016
- DRC 2016
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Modeling gate-pitch scaling impact on stress-induced mobility and external resistance for 20nm-node MOSFETs
- Seong-Dong Kim
- Sameer Jain
- et al.
- 2010
- SISPAD 2010