Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification
- Doowon Leey
- Tom Kolan
- et al.
- 2016
- DAC 2016
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Hybrid checking for microarchitectural validation of microprocessor designs on acceleration platforms
- Debapriya Chatterjee
- Biruk Mammo
- et al.
- 2013
- ICCAD 2013