Enhanced grain growth of polycrystalline silicon at low temperature by dopant redistribution
- T.C. Chou
- C.Y. Wong
- et al.
- 1987
- Journal of Applied Physics
Publications
230 results for King-Ning Tu
In situ resistivity measurement of cobalt silicide formation
- G. Ottaviani
- K.N. Tu
- et al.
- 1987
- Journal of Applied Physics
Crystallization, resistivity and microstructure of co-deposited metal-silicon thin film alloys
- D.A. Smith
- K.N. Tu
- et al.
- 1987
- Ultramicroscopy
Enhanced grain growth of phosphorus-doped polycrystalline silicon by titanium silicide formation
- T.C. Chou
- C.Y. Wong
- et al.
- 1986
- Applied Physics Letters
Stability of oxides grown on tantalum silicide surfaces
- A. Cros
- K.N. Tu
- 1986
- Journal of Applied Physics
Effect of temperature on electrical and microstructural changes of coevaporated Ir-Si alloy films
- B.Z. Weiss
- K.N. Tu
- et al.
- 1986
- Journal of Applied Physics
Titanium-tungsten contacts to silicon. II. Stability against aluminum penetration
- S.E. Babcock
- K.N. Tu
- 1986
- Journal of Applied Physics
Electrical transport properties of V3Si, V5Si3, and VSi2 thin films
- F. Nava
- O. Bisi
- et al.
- 1986
- Physical Review B
Schottky-barrier heights of Ti and TiSi2 on n-type and p-type Si(100)
- M.O. Aboelfotoh
- K.N. Tu
- 1986
- Physical Review B
Electrical characterization of alloy thin films of VSi2 and V3Si
- F. Nava
- O. Bisi
- et al.
- 1986
- Thin Solid Films