Method for imaging sidewalls by atomic force microscopy
- Yves Martin
- H. Kumar Wickramasinghe
- 1994
- Applied Physics Letters
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56 results for H. Kumar Wickramasinghe
Apertureless near-field optical microscope
- F. Zenhausern
- M.P. O'Boyle
- et al.
- 1994
- Applied Physics Letters
Attractive mode force microscopy using a feedback-controlled fiber interferometer
- M. Nonnenmacher
- M. Vaez-Iravani
- et al.
- 1992
- Review of Scientific Instruments
Scanning probe microscopy of thermal conductivity and subsurface properties
- M. Nonnenmacher
- H.K. Wickramasinghe
- 1992
- Applied Physics Letters
Surface investigations with a Kelvin probe force microscope
- M. Nonnenmacher
- M.P. O'Boyle
- et al.
- 1992
- Ultramicroscopy
Optical absorption spectroscopy by scanning force microscopy
- M. Nonnenmacher
- H.K. Wickramasinghe
- 1992
- Ultramicroscopy
Kelvin probe force microscopy
- M. Nonnenmacher
- M.P. O'Boyle
- et al.
- 1991
- Applied Physics Letters
Lateral dopant profiling on a 100 nm scale by scanning capacitance microscopy
- C.C. Williams
- J. Slinkman
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Scanning probe microscopy: Current status and future trends
- H. Kumar Wickramasinghe
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Magnetic force microscopy with 25 nm resolution
- Philip C. D. Hobbs
- David W. Abraham
- et al.
- 1989
- Applied Physics Letters