Transistor Matching and Fin Angle Variation in FinFET Technology
- Samarth Agarwal
- Terence B. Hook
- et al.
- 2015
- IEEE T-ED
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6 results for Samarth Agarwal
Hybrid methodology to model random dopant fluctuations in low doped FinFETs
- Samarth Agarwal
- Jeffrey B. Johnson
- et al.
- 2015
- Journal of Computational Electronics
Random dopant fluctuation induced variability in undoped channel si gate all around nanowire n-MOSFET
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2015
- IEEE T-ED
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2014
- IEEE T-ED
Finite element based three dimensional Schrödinger solver for nano-scale devices
- Samarth Agarwal
- Kai Xiu
- et al.
- 2014
- Journal of Computational Electronics
Ab initio study of metal grain orientation-dependent work function and its impact on FinFET variability
- Samarth Agarwal
- Rajan Kumar Pandey
- et al.
- 2013
- IEEE T-ED