Random dopant fluctuation induced variability in undoped channel si gate all around nanowire n-MOSFET
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2015
- IEEE T-ED
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5 results for Valipe Ramgopal Rao
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- Kaushik Nayak
- Samarth Agarwal
- et al.
- 2014
- IEEE T-ED
Negative differential conductivity and carrier heating in gate-all-around Si nanowire FETs and its impact on CMOS logic circuits
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- Japanese Journal of Applied Physics
CMOS logic device and circuit performance of Si gate all around nanowire MOSFET
- Kaushik Nayak
- Mohit Bajaj
- et al.
- 2014
- IEEE T-ED
A binary tunnel field effect transistor with a steep sub-threshold swing and increased on current
- Ram Asra
- Kota V. R. M. Murali
- et al.
- 2010
- Japanese Journal of Applied Physics