Meeting the challenge of multiple threshold voltages in highly scaled undoped FinFETs
- Ramachandran Muralidhar
- Jin Cai
- et al.
- 2013
- IEEE T-ED
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Compact modeling of variation in FinFET SRAM cells
- Darsen D. Lu
- Chung-Hsun Lin
- et al.
- 2010
- IEEE Design and Test of Computers
Performance-aware corner model for design for manufacturing
- Chung-Hsun Lin
- Mohan V. Dunga
- et al.
- 2009
- IEEE Transactions on Electron Devices