Benchmark tests for MOSFET compact models with application to the PSP model
- Xin Li
- Weimin Wu
- et al.
- 2009
- IEEE Transactions on Electron Devices
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13 results for Josef Watts
Modeling of variation in submicrometer CMOS ULSI technologies
- Scott K. Springer
- Sungjae Lee
- et al.
- 2006
- IEEE Transactions on Electron Devices
Netlisting and modeling well-proximity effects
- Josef Watts
- Ke-Wei Su
- et al.
- 2006
- IEEE Transactions on Electron Devices