Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing
- Jeffrey D. Wilkinson
- Brett M. Clark
- et al.
- 2011
- IRPS 2011
Publications
Date
Featured collections
Popular topics
3 results for Brett M. Clark
Energy Dependent Efficiency in Low Background Alpha Measurements and Impacts on Accurate Alpha Characterization
- Hiroyoshi Kawasaki
- Brett M. Clark
- et al.
- 2015
- IEEE TNS
Sources of variability in alpha emissivity measurements at la and ULA levels, a multicenter study
- Brendan D. McNally
- Stuart Coleman
- et al.
- 2014
- Nucl. Instrum. Methods Phys. Res