In Situ Electron Microscopy Studies of Surface Dynamical Processes
- Ruud M. Tromp
- 1998
- Microscopy and Microanalysis
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226 results for Rudolf M. Tromp
HIGH RESOLUTION ION SCATTERING ANALYSIS OF SEMICONDUCTOR SURFACES AND INTERFACES.
- R.M. Tromp
- 1984
- ICPS Physics of Semiconductors 1984
STUDY OF SILICON CONTAMINATION AND NEAR-SURFACE DAMAGE CAUSED BY CF//4/H//2 REACTIVE ION ETCHING.
- G.S. Oehrlein
- R.M. Tromp
- et al.
- 1983
- ECS Meeting 1983
Low-Energy Electron Irradiation Damage in Few-Monolayer Pentacene Films
- A. Tebyani
- F.B. Baalbergen
- et al.
- 2021
- Journal of Physical Chemistry C
Key Role of Very Low Energy Electrons in Tin-Based Molecular Resists for Extreme Ultraviolet Nanolithography
- Ivan Bespalov
- Yu Zhang
- et al.
- 2020
- ACS AMI
Equilibrium shape of graphene domains on Ni(111)
- Meifang Li
- James B. Hannon
- et al.
- 2013
- Physical Review B - CMMP
Growth and stability of Bi films on Si(111) studied by leem
- G.E. Thayer
- J.T. Sadowski
- et al.
- 2003
- Microscopy and Microanalysis
In situ transmission electron microscopy of copper electrodeposition
- Frances M. Ross
- Mark J. Williamson
- et al.
- 2002
- Microscopy and Microanalysis
Extracting transverse electron mean free paths in graphene at low energy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2023
- Ultramicroscopy
Gun energy filter for a low energy electron microscope
- Rudolf M. Tromp
- James B. Hannon
- et al.
- 2023
- Ultramicroscopy