Optical Near-Field Electron Microscopy
- Raphaël Marchand
- Radek Šachl
- et al.
- 2021
- Physical Review Applied
Publications
Date
Featured collections
Popular topics
32 results for Sense Jan van der Molen
Complementary LEEM and eV-TEM for imaging and spectroscopy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2021
- Ultramicroscopy
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis
- T. A. de Jong
- D. N.L. Kok
- et al.
- 2020
- Ultramicroscopy
Key Role of Very Low Energy Electrons in Tin-Based Molecular Resists for Extreme Ultraviolet Nanolithography
- Ivan Bespalov
- Yu Zhang
- et al.
- 2020
- ACS AMI
Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene
- Daniël Geelen
- J. Jobst
- et al.
- 2019
- Physical Review Letters
Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate
- J. Jobst
- Laurens M. Boers
- et al.
- 2019
- Ultramicroscopy
Intrinsic stacking domains in graphene on silicon carbide: A pathway for intercalation
- T. A. de Jong
- E. E. Krasovskii
- et al.
- 2018
- Physical Review Materials
Charge Catastrophe and Dielectric Breakdown during Exposure of Organic Thin Films to Low-Energy Electron Radiation
- A. Thete
- Daniël Geelen
- et al.
- 2017
- Physical Review Letters
Reprint of Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy