SRAM write-ability improvement with transient negative bit-line voltage
- Saibal Mukhopadhyay
- Rahul M. Rao
- et al.
- 2011
- IEEE Transactions on VLSI Systems
Publications
Date
Featured collections
Popular topics
51 results for Ching-Te Chuang
Self-repairing SRAM using on-chip detection and compensation
- Niladri Narayan Mojumder
- Saibal Mukhopadhyay
- et al.
- 2010
- IEEE Transactions on VLSI Systems
TCAD/physics-based analysis of high-density dual-BOX FD/SOI SRAM cell with improved stability
- Keunwoo Kim
- Jente B. Kuang
- et al.
- 2009
- IEEE Transactions on Electron Devices
Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability
- Aditya Bansal
- Rahul Rao
- et al.
- 2009
- Microelectronics Reliability
Design of sub-90 nm low-power and variation tolerant PD/SOI SRAM cell based on dynamic stability metrics
- Rajiv V. Joshi
- Saibal Mukhopadhyay
- et al.
- 2009
- IEEE Journal of Solid-State Circuits
Selective device structure scaling and parasitics engineering: A way to extend the technology roadmap
- Lan Wei
- Jie Deng
- et al.
- 2009
- IEEE Transactions on Electron Devices
An on-chip test structure and digital measurement method for statistical characterization of local random variability in a process
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2008
- IEEE Journal of Solid-State Circuits
Device design and optimization methodology for leakage and variability reduction in sub-45-nm FD/SOI SRAM
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2008
- IEEE Transactions on Electron Devices
Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- Microelectronics Journal
The impact of device footprint scaling on high-performance CMOS logic technology
- Jie Deng
- Keunwoo Kim
- et al.
- 2007
- IEEE Transactions on Electron Devices