Temperature Evolution in Nanoscale Carbon-Based Memory Devices Due to Local Joule Heating
- Tobias Bachmann
- A.M. Alexeev
- et al.
- 2017
- IEEE TNANO
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13 results for C. David Wright
Ultra high density scanning electrical probe phase-change memory for archival storage
- Lei Wang
- C. David Wright
- et al.
- 2011
- Japanese Journal of Applied Physics
Write strategies for multiterabit per square inch scanned-probe phase-change memories
- C. David Wright
- Purav Shah
- et al.
- 2010
- Applied Physics Letters