Fast characterization of the Static Noise Margin degradation of cross-coupled inverters and correlation to BTI instabilities in MG/HK devices
- Andreas Kerber
- N. Pimparkar
- et al.
- 2011
- IRPS 2011
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Compact modeling of FinFETs featuring independent-gate operation mode
- C.-H. Lin
- X. Xi
- et al.
- 2005
- VLSI Technology 2005