Correlation of Id- and Ig-random telegraph noise to positive bias temperature instability in scaled high-κ/metal gate n-type MOSFETs
- Chia-Yu Chen
- Qiushi Ran
- et al.
- 2011
- IRPS 2011
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3 results for Robert W. Dutton
Characterization of RF power BJT and improvement of thermal stability with nonlinear base ballasting
- Jaejune Jang
- Edwin C. Kan
- et al.
- 1998
- IEEE Journal of Solid-State Circuits
A General Solution Method for Two-Dimensional Nonplanar Oxidation
- Daeje Chin
- Soo-Young Oh
- et al.
- 1983
- IEEE T-ED