Gas source depletion study of high-order silanes of silicon-based epitaxial layers grown with RPCVD and low temperaturesKeith ChungPaul Brabantet al.2012ECS Meeting 2012
Thermal budget reduction and throughput enhancement for CMOS Epi stressors via wet clean interface contamination evaluation and controlPaul BrabantKeith Chunget al.2011ASMC 2011
High strain embedded-SiGe via low temperature reduced pressure chemical vapor depositionHong HePaul Brabantet al.2012Thin Solid Films