On the high-field transport and uniaxial stress effect in Ge PFETs
- Masaharu Kobayashi
- Jérǒme Mitard
- et al.
- 2011
- IEEE T-ED
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Impact of the electrochemical properties of silicon wafer surfaces on copper outplating from HF solutions
- I. Teerlinck
- P.W. Mertens
- et al.
- 1996
- JES