Fabrication and analysis of vertical p-type InAs-Si nanowire tunnel FETs
- D. Cutaia
- Kirsten E. Moselund
- et al.
- 2015
- EUROSOI-ULIS 2015
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29 results for Christopher M. Breslin
A novel integrated reliability test system for BEOL TDDB study
- Jifeng Chen
- Peilin Song
- et al.
- 2012
- ISTFA 2012
Microstructure, impurity and metal cap effects on Cu electromigration
- C. K. Hu
- Lynne Gignac
- et al.
- 2012
- AIP-CP 2012
Effects of Al and Mn impurities on Cu electromigration
- C.-K. Hu
- J. Ohm
- et al.
- 2011
- ADMETA 2011
An evaluation of Fuchs-Sondheimer and Mayadas-Shatzkes models below 14nm node wide lines
- R. S. Smith
- E. T. Ryan
- et al.
- 2019
- AIP Advances
Demonstration of a high extinction ratio monolithic CMOS integrated nanophotonic transmitter and 16 Gb/s optical link
- Douglas M. Gill
- Jonathan E. Proesel
- et al.
- 2015
- IEEE JSTQE
A Sub-Micron Spherical Atomic Force Microscopic Tip for Surface Measurements
- Huan Hu
- Bin Shi
- et al.
- 2020
- Langmuir
Facet-selective group-III incorporation in InGaAs template assisted selective epitaxy
- Mattias Borg
- Lynne Gignac
- et al.
- 2018
- Nanotechnology
Template-assisted selective epitaxy of III-V nanoscale devices for co-planar heterogeneous integration with Si
- Heinz Schmid
- Mattias Borg
- et al.
- 2015
- Applied Physics Letters
Vertical InAs-Si gate-all-around tunnel FETs integrated on Si using selective epitaxy in nanotube templates
- D. Cutaia
- Kirsten E. Moselund
- et al.
- 2015
- IEEE J-EDS