SRAM stability characterization using tunable ring oscillators in 45nm CMOS
- Jason Tsai
- Seng Oon Toh
- et al.
- 2010
- ISSCC 2010
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3 results for Zheng Guo
Technology variability from a design perspective
- Borivoje Nikolić
- Ji-Hoon Park
- et al.
- 2011
- IEEE TCAS-I
Large-scale SRAM variability characterization in 45 nm CMOS
- Zheng Guo
- Andrew Carlson
- et al.
- 2009
- IEEE Journal of Solid-State Circuits