Publications

2 results for Stephan Waidmann

Stress liner effects for 32-nm SOI MOSFETs with HKMG
- - Ming Cai
  - Karthik Ramani
  - et al.
- 2010
- IEEE T-ED
Implementation of robust nickel alloy salicide process for high-performance 65nm SOI CMOS manufacturing
- - Jay Strane
  - David Brown
  - et al.
- 2007
- VLSI-TSA 2007