Auger and ellipsometric studies of ultra-thin PbO growth on lead
- N.J. Chou
- J.M. Eldridge
- et al.
- 1973
- Journal of Electronic Materials
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13 results for R. Hammer
Effects of Insulator Thickness Fluctuations on MNOS Charge Storage Characteristics
- N.J. Chou
- Joseph A. Aboaf
- et al.
- 1972
- IEEE T-ED
Electroreflectance spectra due to free carriers in semiconductors
- J.D. Axe
- R. Hammer
- 1967
- Physical Review