Electrical characterization of gate oxides by scanning probe microscopies
- R. Ludeke
- 2002
- Journal of Non-Crystalline Solids
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87 results for R. Ludeke
Imaging of trapped charge in SiO2 and at the SiO2-Si interface
- R. Ludeke
- E. Cartier
- 2001
- Applied Physics Letters
Hot carrier transport effects in Al2O3-based metal-oxide-semiconductor structures
- R. Ludeke
- M.T. Cuberes
- et al.
- 2000
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Local transport and trapping issues in Al2O3 gate oxide structures
- R. Ludeke
- M.T. Cuberes
- et al.
- 2000
- Applied Physics Letters
Determination of the energy-dependent conduction band mass in SiO2
- R. Ludeke
- E. Cartier
- et al.
- 1999
- Applied Physics Letters
Quantum interference in SiO2: A conduction-band mass reappraisal
- R. Ludeke
- H.J. Wen
- et al.
- 1998
- Applied Physics Letters
Localized degradation studies of ultrathin gate oxides
- H.J. Wen
- R. Ludeke
- 1998
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Current oscillations in thin metal-oxide-semiconductor structures observed by ballistic electron emission microscopy
- H.J. Wen
- R. Ludeke
- et al.
- 1998
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Atomic-scale studies of electron transport through MOS structures
- H.J. Wen
- R. Ludeke
- et al.
- 1998
- Applied Surface Science
Localized electron trapping and trap distributions in SiO2 gate oxides
- R. Ludeke
- H.J. Wen
- 1997
- Applied Physics Letters