Evaluation of channel hot carrier effects in n-MOS transistors at 77 K with the charge pumping technique
- P. Heremans
- Y.-C. Sun
- et al.
- 1987
- Applied Surface Science
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Thermal oxidation of silicon: New experimental results and models
- Eugene A. Irene
- R. Ghez
- 1987
- Applied Surface Science
Hot electrons in silicon dioxide: Ballistic to steady-state transport
- D.J. DiMaria
- M.V. Fischetti
- 1987
- Applied Surface Science