Charge trapping in n-AlxGa1-xAs "insulators" and related device instabilitiesT.N. TheisB.D. Parker1987Applied Surface Science
Thermal oxidation of silicon: New experimental results and modelsEugene A. IreneR. Ghez1987Applied Surface Science
High temperature reaction and defect chemistry at the Si/SiO2 interfaceK. HofmannG.W. Rubloffet al.1987Applied Surface Science