Weighted mechanical models for residual stress determination using x-ray diffraction
- Conal E. Murray
- Stephen W. Bedell
- et al.
- 2013
- Journal of Applied Physics
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2355 results at Journal of Applied Physics
Generalized hydrogen release-reaction model for the breakdown of modern gate dielectrics
- Ernest Y. Wu
- Jordi Suñé
- 2013
- Journal of Applied Physics
Dielectric properties of Si3-ξGeξN4 and Si3-ξCξN4: A density functional study
- Kanchan Ulman
- Rajesh Sathiyanarayanan
- et al.
- 2013
- Journal of Applied Physics
Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf 1-xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme
- Relja Vasić
- Steven Consiglio
- et al.
- 2013
- Journal of Applied Physics
Characterization of room temperature recrystallization kinetics in electroplated copper thin films with concurrent x-ray diffraction and electrical resistivity measurements
- Mikhail Treger
- Christian Witt
- et al.
- 2013
- Journal of Applied Physics
Evolution of strain energy during recrystallization of plated Cu films
- Conal E. Murray
- Robert Rosenberg
- et al.
- 2013
- Journal of Applied Physics
Wetting at the BaTiO3/Pt interface
- Kurt D. Fredrickson
- Agham B. Posadas
- et al.
- 2013
- Journal of Applied Physics
Equivalence of Kröner and weighted Voigt-Reuss models for x-ray stress determination
- 2013
- Journal of Applied Physics
Making use of x-ray optical effects in photoelectron-, Auger electron-, and x-ray emission spectroscopies: Total reflection, standing-wave excitation, and resonant effects
- See-Hun Yang
- Alexander X. Gray
- et al.
- 2013
- Journal of Applied Physics
Mid-infrared absorptance of silicon hyperdoped with chalcogen via fs-laser irradiation
- Meng-Ju Sher
- Yu-Ting Lin
- et al.
- 2013
- Journal of Applied Physics