Post-breakdown statistics and acceleration characteristics in high-K dielectric stacks
- Ernest Wu
- Jordi Sune
- et al.
- 2011
- IRPS 2011
Publications
14 results at IRPS 2011
Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses
- Frederic Monsieur
- Eduard Cartier
- et al.
- 2011
- IRPS 2011
Metastability of hydrogenated amorphous silicon passivation on crystalline silicon and implication to photovoltaic devices
- Bahman Hekmatshoar
- Davood Shahrjerdi
- et al.
- 2011
- IRPS 2011
Impact of source/drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs
- Rajan Arora
- Sachin Seth
- et al.
- 2011
- IRPS 2011