Grazing incidence synchrotron x-ray diffraction method for analyzing thin films
- G. Lim Parrish
- C. Ortiz
- et al.
- 2011
- Journal of Materials Research
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X-ray depth profiling of iron oxide thin films
- Michael F. Toney
- Ting C. Huang
- et al.
- 2011
- Journal of Materials Research
Transformation Toughening of Glass Ceramics
- D.R. Clarke
- B. Schwartz
- 2011
- Journal of Materials Research
Atomic structure of a Σ = 21 grain boundary
- William Krakow
- 2011
- Journal of Materials Research
The effect of grain size on microstructure and stress relaxation in polycrystalline Y1Ba2Cu3O7-δ
- T.M. Shaw
- S. Shinde
- et al.
- 2011
- Journal of Materials Research
Structural and Optical Transformations by Laser Irradiation of Insb-Based Thin Films
- J. Solis
- K.A. Rubin
- et al.
- 2011
- Journal of Materials Research
Possible Evidence for Overcoordination at Semiconductor Grain Boundaries
- W. Krakow
- A.A. Levi
- et al.
- 2011
- Journal of Materials Research
Rietveld powder structure refinement of Na2Al2Ti6O16; Comparison of synchrotron radiation and conventional x-ray tube datasets
- H. Toraya
- N. Masciocchi
- et al.
- 2011
- Journal of Materials Research
Instrumentation of A Conventional Hardness Tester for Load-Displacement Measurement During Indentation
- R.F. Cook
- 2011
- Journal of Materials Research
Tensile fracture and fractographic analysis of 1045 spheroidized steel under hydrostatic pressure
- A.S. Kao
- W.A. Spitzig
- et al.
- 2011
- Journal of Materials Research