Calculations of the energy loss of 4He ions in solid elements
- W.K. Chu
- V.L. Moruzzi
- et al.
- 2008
- Journal of Applied Physics
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2357 results at Journal of Applied Physics
Structure of thin lead oxide layers as determined by x-ray diffraction
- T.B. Light
- J.M. Eldridge
- et al.
- 2008
- Journal of Applied Physics
Saturation and recovery of the direct interband absorption in semiconductors
- J. Reintjes
- J.C. McGroddy
- et al.
- 2008
- Journal of Applied Physics
Electromigration of Ni in Al thin-film conductors
- F.M. D'Heurle
- A. Gangulee
- et al.
- 2008
- Journal of Applied Physics
Surface composition and chemistry of evaporated Permalloy films observed by x-ray photoemission spectroscopy and by Auger electron spectroscopy
- R.A. Pollak
- C.H. Bajorek
- 2008
- Journal of Applied Physics
Magnetization of amorphous Gd-Co-Ni films
- R. Hasegawa
- R.C. Taylor
- 2008
- Journal of Applied Physics
Geometry dependence of thin-film transverse thermoelectric voltages
- R.J. Von Gutfeld
- 2008
- Journal of Applied Physics
Specimen replication for electron microscopy using x rays and x-ray resist
- Ralph Feder
- David Sayre
- et al.
- 2008
- Journal of Applied Physics
Tables of stopping cross sections for 4He ions in solids
- J.F. Ziegler
- W.K. Chu
- 2008
- Journal of Applied Physics
Contact metallurgy for shallow junction Si devices
- C.J. Kircher
- 2008
- Journal of Applied Physics