Kirkendall study of electromigration in thin films
- P.S. Ho
- J.E. Lewis
- et al.
- 1975
- Thin Solid Films
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- Materials Discovery
3434 results for Materials Discovery
The mechanism of wear in magnetic recording disk files
- F.E. Talke
- J.L. Su
- 1975
- Tribology International
Sources of conduction band polarization in the driving force for electromigration
- Rolf Landauer
- 1975
- Thin Solid Films
Implanted noble gas atoms as diffusion markers in silicide formation
- W.K. Chu
- S.S. Lau
- et al.
- 1975
- Thin Solid Films
Absence of non-shorting breakdown behaviour in AlSi3N4Si structures
- N. Klein
- C.M. Osburn
- et al.
- 1975
- Thin Solid Films
A dislocation cascade mechanism in superplasticity
- P. Chaudhari
- 1974
- Metallurgical and Materials Transactions B: Process Metallurgy and Materials Processing Science
Delay-bond graph models for geared torsional systems
- N.T. Tsai
- S.M. Wang
- 1974
- Journal of Applied Mechanics, Transactions ASME
Static determinaoy in the theory of finite width foil bearings
- W.E. Langlois
- 1974
- Journal of Applied Mechanics, Transactions ASME
Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation
- S.S. Lau
- W.K. Chu
- et al.
- 1974
- Thin Solid Films
Grain growth in Ni-Fe thin films
- A. Gangulee
- S. Krongelb
- et al.
- 1974
- Thin Solid Films