1 μm MOSFET VLSI Technology: Part VIIII—Radiation Effects
- John M. Aitken
- 1979
- IEEE T-ED
Publications
465 results at IEEE T-ED
1 μm MOSFET VLSI Technology: Part V—A Single-Level Polysilicon Technology Using Electron-Beam Lithography
- William R. Hunter
- Linda Ephrath
- et al.
- 1979
- IEEE T-ED
Spatial Distribution of Wall Charge Density in AC Plasma Display Panels
- Omesh Sahni
- W.P. Jones
- 1979
- IEEE T-ED
Fabrication of an Integrated, Planar Silicon Ink-Jet Structure
- Kurt E. Petersen
- 1979
- IEEE T-ED
Modeling Diffusion and Collection of Charge from Ionizing Radiation in Silicon Devices
- Scott Kirkpatrick
- 1979
- IEEE T-ED
Hot-Electron Emission in N-Channel IGFET's
- Tak H. Ning
- Ronald R. Troutman
- 1979
- IEEE T-ED
1 μm MOSFET VLSI Technology: Part VI—Electron-Beam Lithography
- Warren D. Grobman
- Hans E. Luhn
- et al.
- 1979
- IEEE T-ED
Electron-Beam Resist Edge Profile Simulation
- David F. Kyser
- Chiu H. Ting
- 1979
- IEEE T-ED
VLSI Limitations from Drain-Induced Barrier Lowering
- Ronald R. Troutman
- 1979
- IEEE T-ED
Simple Analytical Models for the Temperature Dependent Threshold Behavior of Depletion-Mode Devices
- Fritz H. Gaensslen
- 1979
- IEEE T-ED