Performance characteristics of diazo-type photoresists under e-beam and optical exposureJane M. ShawMichael Hatzakis1978IEEE T-ED
A review of recent experiments pertaining to hole transport in si3n4Patrick C. ArnettZeev A. Weinberg1978IEEE T-ED
TP-B5 Beam-Induced Switching Phenomena in ZnS:Mn BL Memory DevicesO. SahniW.E. Howardet al.1978IEEE T-ED
The Importance of Insulator Properties in a Thin-Film Electroluminescent DeviceWebster E. Howard1977IEEE T-ED
VI-4 Secondary Climb in the Optical Degradation of DH GaAs/GaAlAs Laser MaterialG.R. WoolhouseB. Monemaret al.1977IEEE T-ED
IIIa-2 Characterization of Electronic Gate Current in IGFETS Operating in the Linear and Saturation RegionsP.E. CottrellR.R. Troutmanet al.1977IEEE T-ED