A maximum extreme-value distribution model for switching conductance of oxide-RRAM in memory applications
- Ernest Wu
- Takashi Ando
- et al.
- 2020
- Applied Physics Letters
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Impact of substrate induced band tail states on the electronic and optical properties of MoS2
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- Applied Physics Letters
Nanoscale analysis of electrical junctions in InGaP nanowires grown by template-assisted selective epitaxy
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- Applied Physics Letters
Highly pure single photon emission from spectrally uniform surface-curvature directed mesa top single quantum dot ordered array
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- Applied Physics Letters
Ambipolar quantum dots in undoped silicon fin field-effect transistors
- Andreas V. Kuhlmann
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- Applied Physics Letters
Effect of hot carrier stress on device junctions measured by electron holography and scanning capacitance microscopy
- Yun-Yu Wang
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- 2018
- Applied Physics Letters
Electron scattering at interfaces in nano-scale vertical interconnects: A combined experimental and ab initio study
- Nicholas A. Lanzillo
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- 2018
- Applied Physics Letters
Strain, stress, and mechanical relaxation in fin-patterned Si/SiGe multilayers for sub-7 nm nanosheet gate-all-around device technology
- S. Reboh
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- et al.
- 2018
- Applied Physics Letters
Bio-inspired silicon nanospikes fabricated by metal-assisted chemical etching for antibacterial surfaces
- Huan Hu
- Vince Siu
- et al.
- 2017
- Applied Physics Letters
Bulk-impurity induced noise in large-area epitaxial thin films of topological insulators
- Saurav Islam
- Semonti Bhattacharyya
- et al.
- 2017
- Applied Physics Letters