Piezoresistive cantilevers as optical sensors for scanning near-field microscopy
- P. Bauer
- B. Hecht
- et al.
- 1995
- Ultramicroscopy
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"Tunnel" near-field optical microscopy: TNOM-2
- B. Hecht
- D. Pohl
- et al.
- 1995
- Ultramicroscopy
Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopy
- P.E. Batson
- 1995
- Ultramicroscopy
Light confinement in scanning near-field optical microscopy
- Lukas Novotny
- Dieter W. Pohl
- et al.
- 1995
- Ultramicroscopy
Combined aperture SNOM/PSTM: best of both worlds?
- B. Hecht
- H. Heinzelmann
- et al.
- 1995
- Ultramicroscopy
Imaging with a low-energy electron microscope
- R.M. Tromp
- M.C. Reuter
- 1993
- Ultramicroscopy
Silicon L2, 3 near-edge fine structure in confined volumes
- P.E. Batson
- 1993
- Ultramicroscopy
Comment on "on the electron and metallic ion emission from nanotips fabricated by field-surface-melting technique: experiments on W and Au tips" by Vu Thien Binh and N. García
- Hans-Werner Fink
- 1993
- Ultramicroscopy
Electron microscopy of the grain structure of metal films and lines
- David A. Smith
- Martin Small
- et al.
- 1993
- Ultramicroscopy
Building a micrometer-scale electrostatic lens by hand
- G.M. Shedd
- H. Schmid
- et al.
- 1993
- Ultramicroscopy