Top-down topography of deeply etched silicon in the scanning electron microscope
- Oliver C. Wells
- Conal E. Murray
- et al.
- 2004
- Review of Scientific Instruments
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Precise calibration for surface stress induced optical deflection measurements
- P. Kury
- P. Zahl
- et al.
- 2004
- Review of Scientific Instruments
Circuit and technique for characterizing switching delay history effects in silicon-on-insulator logic gates
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2004
- Review of Scientific Instruments
Wide bore helical inductively pumped argon laser
- H. Ling
- J. Colombo
- et al.
- 2003
- Review of Scientific Instruments
Apparatus for direct recording of magneto-optic rotation and magnetic hysteresis
- E. Sawatzky
- D.H. Horne
- 2003
- Review of Scientific Instruments
A rotating sample holder using flexible fiber optics for the excitation and detection of photoluminescence at liquid helium temperatures
- Eugene Tynan
- Benjamin Welber
- 2003
- Review of Scientific Instruments
Collector turret for scanning electron microscope
- Oliver C. Wells
- Conrad G. Bremer
- 2003
- Review of Scientific Instruments
Synthesis of diffraction line profiles from continuous scanning data
- A. Gangulee
- 2003
- Review of Scientific Instruments
A system for determining the mass and energy of particles incident on a substrate in a planar diode sputtering system
- J.W. Coburn
- 2003
- Review of Scientific Instruments
High intensity hot filament vacuum ultraviolet light source
- D.E. Eastman
- J.J. Donelon
- 2003
- Review of Scientific Instruments