Operational amplifier based test structure for transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2008
- ICMTS 2008
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CMOS latch metastability characterization at the 65-nm-technology node
- Manjul Bhushan
- Mark B. Ketchen
- et al.
- 2008
- ICMTS 2008