Publications

6 results at IEEE International SOI Conference 2005

Development of stacking faults in strained silicon layers
- - S.W. Bedell
  - A. Reznicek
  - et al.
- 2005
- IEEE International SOI Conference 2005
Back-gate controlled READ SRAM with improved stability
- - Jae-Joon Kim
  - Keunwoo Kim
  - et al.
- 2005
- IEEE International SOI Conference 2005
Circuit to measure high speed pulse I-V characteristics with only DC I/O's
- - Mark B. Ketchen
  - Manjul Bhushan
  - et al.
- 2005
- IEEE International SOI Conference 2005
Effect of contact liner stress in high-performance FDSOI devices with ultra-thin silicon channels and 30 nm gate lengths
- - D. Singh
  - J. Hergenrother
  - et al.
- 2005
- IEEE International SOI Conference 2005
High-density logic techniques with reduced-stack double-gate MOSFETs
- - Meng-Hsueh Chiang
  - Keunwoo Kim
  - et al.
- 2005
- IEEE International SOI Conference 2005
Dynamic circuit techniques using independently controlled double-gate devices
- - J.B. Kuang
  - K. Kim
  - et al.
- 2005
- IEEE International SOI Conference 2005