Circuit to measure high speed pulse I-V characteristics with only DC I/O's
- Mark B. Ketchen
- Manjul Bhushan
- et al.
- 2005
- IEEE International SOI Conference 2005
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6 results at IEEE International SOI Conference 2005
Development of stacking faults in strained silicon layers
- S.W. Bedell
- A. Reznicek
- et al.
- 2005
- IEEE International SOI Conference 2005
Effect of contact liner stress in high-performance FDSOI devices with ultra-thin silicon channels and 30 nm gate lengths
- D. Singh
- J. Hergenrother
- et al.
- 2005
- IEEE International SOI Conference 2005
High-density logic techniques with reduced-stack double-gate MOSFETs
- Meng-Hsueh Chiang
- Keunwoo Kim
- et al.
- 2005
- IEEE International SOI Conference 2005
Dynamic circuit techniques using independently controlled double-gate devices
- J.B. Kuang
- K. Kim
- et al.
- 2005
- IEEE International SOI Conference 2005
Back-gate controlled READ SRAM with improved stability
- Jae-Joon Kim
- Keunwoo Kim
- et al.
- 2005
- IEEE International SOI Conference 2005