Novel three-terminal negative differential conductance device in silicon: The hot-electron phonon-emission field-effect transistor
- S.J. Koester
- K. Ismail
- et al.
- 1997
- DRC 1997
Publications
Date
Featured collections
Popular topics
2 results at DRC 1997
Temporal characterization of CMOS circuits by time resolved emission microscopy
- J.C. Tsang
- J.A. Kash
- 1997
- DRC 1997