Morphological transformations in the crystallization of TeSe-halide thin filmsA. BlatterC. Ortizet al.1993MRS Proceedings 1993
Effect of annealing on the Cu distribution and Al2Cu precipitation in Al(Cu) thin filmsE.G. ColganK.P. Rodbellet al.1993MRS Proceedings 1993
Elecromigration damage in fine Al alloy lines due to interfacial diffusionC.-K. HuM.B. Smallet al.1993MRS Proceedings 1993