ACCURATE FAULT MODELING AND EFFICIENT SIMULATION OF DIFFERENTIAL CVS CIRCUITS.
- Z. Barzilai
- V.S. Iyengar
- et al.
- 1984
- IEEE ITC 1984
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2 results at IEEE ITC 1984
COST AND SPEED BARRIERS IN LSI/VLSI TESTING - CAN THEY BE OVERCOME BY TESTABILITY DESIGN? .
- Frank F. Tsui
- 1984
- IEEE ITC 1984