Publications

3 results at IEEE ITC 1983

TEST GENERATION FOR FET SWITCHING CIRCUITS.
- - J.P. Roth
  - Vojin G. Oklobdzija
  - et al.
- 1983
- IEEE ITC 1983
VOTE IN FAVOR OF FAULT SIMULATION.
- - J.Lawrence Carter
- 1983
- IEEE ITC 1983
VOTE IN FAVOR OF FAULT SIMULATION.
- - J.Lawrence Carter
- 1983
- IEEE ITC 1983