NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor
- Huimei Zhou
- Miaomiao Wang
- et al.
- 2020
- IRPS 2020
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5 results at IRPS 2020
A new technique for evaluating stacked nanosheet inner spacer TDDB reliability
- Tian Shen
- K. Watanabe
- et al.
- 2020
- IRPS 2020
Neuromorphic Computing with Phase Change, Device Reliability, and Variability Challenges
- Charles Mackin
- Pritish Narayanan
- et al.
- 2020
- IRPS 2020
Open Block Characterization and Read Voltage Calibration of 3D QLC NAND Flash
- 2020
- IRPS 2020
Analysis of BTI, SHE Induced BTI and HCD under Full VG/VD Space in GAA Nano-Sheet N and P FETs
- Nilotpal Choudhury
- Uma Sharma
- et al.
- 2020
- IRPS 2020