Extending the resolution of emission images beyond diffraction limits using deconvolutionFei LanFranco Stellariet al.2016ISTFA 2016
Automated emission data registration and segmentation for IC analysisFranco StellariPeilin Song2016ISTFA 2016
Investigation of phase change memory confined cell endurance using transmission electron microscopy (TEM)Yu ZhuSangbum Kimet al.2016ISTFA 2016