Measurement of back end of line thermal resistance for 3D chip stacks
- E.G. Colgan
- R.J. Polastre
- et al.
- 2013
- SEMI-THERM 2013
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Reduced-order modeling framework for improving spatial resolution of data center transient air temperatures
- Rajat Ghosh
- Yogendra Joshi
- et al.
- 2013
- SEMI-THERM 2013